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Luminar 4020 Thin Film Analyzer

The Luminar 4020 Thin Film analyzer is based on AOTF-NIR technology. It is designed for non-contact measurements of properties of films and coatings.

Description

The Luminar 4020 Thin Film analyzer is based on AOTF-NIR technology. It is designed for non-contact, non-destructive measurements of chemical and physical properties on a wide range of substrates and coatings.

Applications include thickness of organic lacquer or lubricant on metallic foils, tin-plate, resin-coated steel sheets, metallized polymer films, extruded thin films, etc. Thus, the coating weight of adhesive and residual solvents can be routinely measured using this high-speed, on-line analyzer, which can either be mounted on a traveller and scanned across the web or have measurements performed statically.

The Luminar 4020 is not sensitive to ambient light, which is an important advantage. This eases installation requirements in the production environment. A novel optical design eliminates the interference fringes making the measurement of thin films now possible eliminating the need for costly gamma radiation or beta radiation monitors. A leading customer for the Luminar 4020 is 3M, which has used the unit to measure multiple coatings at a time.

Key Features

  • Miniaturized Design Includes Optical Module and Scaled-Down Electronics Mounted on the Optical Module
  • Dual Beam, Pre-aligned Lamp Assembly, InGaAs Detectors
  • No Moving Parts
  • Fast Scanning Speed – 16,000 Wavelengths per Second
  • SNAP32! Brimrose Analytical Software with Brimrose MACRO Language 

Applications

  • Measurements of chemical compositions
  • Film thickness and film coating potentially to the micron level
  • Coating Material: acrylic, epoxy phenolic,epoxy-urea, multi-layer films and tapes, nitrocellulose, polyesters, etc.
  • Film thickness and residual solvents measured in-line
  • Measurement of coating thickness of organic lacquer or lubricant on metallic foils 

Luminar 4020 Miniature Integrated Film Analyzer
Spectral Range Options 600-1100 nm, 850-1700 nm, 900-1800 nm, 1100-2300 nm
Measurement Modes Transmission
Spectral Resolution 2-10 nm
Wavelength Accuracy ± 0.5 nm
Wavelength Repeatability ± 0.01 nm
Wavelength Increment 1-10 nm (software selectable)
Ambient Light Rejection >106
Signal Digitization 16-bit A/D (1 part in 65,536)
Linearity 0.1%
Sampling Speed 16,000 wavelength/sec
Sampling Area Ø 10 mm
Working Distance 6 mm ± 0.5 mm (from reflecting surface to window flange)
Process Control Up to 16 A/D, 16 D/A Channels and 16 I/O Channels accessed via
MACRO language
D/A outputs can be supplied as isolated 4-20 mA
current loop outputs
Modbus capability (optional) (RS 422/485)
Diagnostics 10 Built-in monitoring sensors
Thickness RangeTypical 0-15 µm (standard)
(above 15 µm it is possible to use models 4030 and 7030)
Permissible Sheet Flutter s±5 mm and ±2 degrees
Power Requirements 24VDC, 110Watts,
110VAC 60Hz,
220VAC 50Hz
Software Package Windows-based analytical software for data acquisition
Options Input/Output Capability
Battery Operation
Wireless Ethernet Interface